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Planar electromagnetic bandgap structures based on polar curves and mapping functions
journal contribution
posted on 2010-04-28, 10:38 authored by Charity B. Mulenga, James FlintJames FlintA type of electromagnetic bandgap structure is described
that is easily parameterized and can produce a range of
square and spiral geometries. Individual electromagnetic bandgap
(EBG) geometries are defined on a cell-by-cell basis in terms of
their convolution factor , which defines the extent to which the elements
are interleaved and controls the coupling slot length between
adjacent elements. Polar equations are used to define the slot locus
which also incorporate a transformation which ensures the slot extends
into the corners of the square unit cell and hence extends the
maximum slot length achievable. The electromagnetic properties
of the so-called polar EBG are evaluated by means of numerical
simulation and measurements and dispersion diagrams are presented.
Finally, the performance is compared with other similar
miniaturized EBG cell geometries. It is shown that the polar EBG
has better angular stability than the equivalent square patch design
and is comparable in terms of performance to other low frequency
EBG elements. At the same time it retains the ability to fine tune
the response by adjusting .
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
MULENGA, C.B. and FLINT, J.A., 2010. Planar electromagnetic bandgap structures based on polar curves and mapping functions. IEEE Transactions on Antennas and Propagation, 58(3), pp. 790-797Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2010Notes
This article was published in the journal, IEEE Transactions on Antennas and Propagation [© IEEE]. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISSN
0018-926XLanguage
- en