Kusmartsev_nanomaterials-10-02234-v2.pdf (9.16 MB)
Download file

Raman spectroscopy imaging of exceptional electronic properties in epitaxial graphene grown on SiC

Download (9.16 MB)
journal contribution
posted on 04.02.2021, 14:36 by A Ben Gouider Trabelsi, Feodor Kusmartsev, Anna KusmartsevaAnna Kusmartseva, FH Alkallas, S Alfaify, M Shkir
© 2020 by the authors. Licensee MDPI, Basel, Switzerland. Graphene distinctive electronic and optical properties have sparked intense interest throughout the scientific community bringing innovation and progress to many sectors of academia and industry. Graphene manufacturing has rapidly evolved since its discovery in 2004. The diverse growth methods of graphene have many comparative advantages in terms of size, shape, quality and cost. Specifically, epitaxial graphene is thermally grown on a silicon carbide (SiC) substrate. This type of graphene is unique due to its coexistence with the SiC underneath which makes the process of transferring graphene layers for devices manufacturing simple and robust. Raman analysis is a sensitive technique extensively used to explore nanocarbon material properties. Indeed, this method has been widely used in graphene studies in fundamental research and application fields. We review the principal Raman scattering processes in SiC substrate and demonstrate epitaxial graphene growth. We have identified the Raman bands signature of graphene for different layers number. The method could be readily adopted to characterize structural and exceptional electrical properties for various epitaxial graphene systems. Particularly, the variation of the charge carrier concentration in epitaxial graphene of different shapes and layers number have been precisely imaged. By comparing the intensity ratio of 2D line and G line—“I2D/IG”—the density of charge across the graphene layers could be monitored. The obtained results were compared to previous electrical measurements. The substrate longitudinal optical phonon coupling “LOOPC” modes have also been examined for several epitaxial graphene layers. The LOOPC of the SiC substrate shows a precise map of the density of charge in epitaxial graphene systems for different graphene layers number. Correlations between the density of charge and particular graphene layer shape such as bubbles have been determined. All experimental probes show a high degree of consistency and efficiency. Our combined studies have revealed novel capacitor effect in diverse epitaxial graphene system. The SiC substrate self-compensates the graphene layer charge without any external doping. We have observed a new density of charge at the graphene—substrate interface. The located capacitor effects at epitaxial graphene-substrate interfaces give rise to an unexpected mini gap in graphene band structure.

Funding

Deanship of Scientific Research at Princess Nourah bint Abdulrahman University through the Fast-track Research Funding Program

History

School

  • Science

Department

  • Physics

Published in

Nanomaterials

Volume

10

Issue

11

Publisher

MDPI

Version

VoR (Version of Record)

Rights holder

© The authors

Publisher statement

This is an Open Access Article. It is published by MDPI under the Creative Commons Attribution 4.0 Unported Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0/

Acceptance date

04/11/2020

Publication date

2020-11-11

Copyright date

2020

ISSN

2079-4991

eISSN

2079-4991

Language

en

Depositor

Dr Anna Kusmartseva . Deposit date: 2 February 2021

Article number

2234