Removal of the Eye-Blink Artifacts From EEGs via STF-TS Modeling and Robust Minimum Variance Beamforming.pdf (1021.16 kB)
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journal contribution
posted on 2010-01-20, 11:23 authored by K. Nazarpour, Yodchanan Wongsawat, Saeid Sanei, Jonathon Chambers, Soontorn OraintaraA novel scheme for the removal of eye-blink (EB)
artifacts from electroencephalogram (EEG) signals based on a
novel space–time–frequency (STF) model of EEGs and robust minimum
variance beamformer (RMVB) is proposed. In this method,
in order to remove the artifact, the RMVB is provided with
a priori information, namely, an estimation of the steering vector
corresponding to the point source EB artifact. The artifact-removed
EEGs are subsequently reconstructed by deflation. The a priori
knowledge, the vector corresponding to the spatial distribution of
the EB factor, is identified using the STF model of EEGs, provided
by the parallel factor analysis (PARAFAC) method. In order to
reduce the computational complexity present in the estimation of
the STF model using the three-way PARAFAC, the time domain is
subdivided into a number of segments, and a four-way array is then
set to estimate the STF-time/segment (TS) model of the data using
the four-way PARAFAC. The correct number of the factors of the
STF model is effectively estimated by using a novel core consistency
diagnostic- (CORCONDIA-) based measure. Subsequently,
the STF-TS model is shown to closely approximate the classic STF
model, with significantly lower computational cost. The results confirm
that the proposed algorithm effectively identifies and removes
the EB artifact from raw EEG measurements.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
Nazarpour, K.. ... et al., 2008. Removal of the eye-blink artifacts from EEGs via STF-TS modeling and robust minimum variance beamforming, 55 (9), pp 2221-2231.Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2008Notes
This article was published in the journal IEEE Transactions on Biomedical Engineering [© IEEE] and is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISSN
0018-9294Language
- en