STEM EBIC mapping of the metal-insulator transition in thin-film NbO2
journal contribution
posted on 2017-10-11, 09:59 authored by William A. Hubbard, Toyanath Joshi, Matthew Mecklenburg, Brian Zutter, Pavel BorisovPavel Borisov, David Lederman, B.C. ReganSTEM EBIC mapping of the metal-insulator transition in thin-film NbO2
History
School
- Science
Department
- Physics
Published in
Microscopy and MicroanalysisVolume
23Issue
S1Pages
1428 - 1429Citation
HUBBARD, W.A. ... et al, 2017. STEM EBIC mapping of the metal-insulator transition in thin-film NbO2. Microscopy and Microanalysis, 23 (S1), pp. 1428-1429.Publisher
Cambridge University Press © Microscopy Society of AmericaVersion
- AM (Accepted Manuscript)
Publication date
2017Notes
This article has been published in a revised form in Microscopy and Microanalysis https://doi.org/10.1017/S1431927617007802. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © copyright holder.ISSN
1431-9276eISSN
1435-8115Publisher version
Language
- en
