1-s2.0-S0026271422002128-main.pdf (8.74 MB)
Self-propagating exothermic reaction assisted Cu clip bonding for effective high-power electronics packaging
journal contribution
posted on 2022-11-14, 10:12 authored by Canyu Liu, Allan Liu, Han Jiang, Shuibao Liang, Zhaoxia ZhouZhaoxia Zhou, Changqing LiuChangqing LiuFor the high-power modules packaging, Cu clip bonding has gained growing interest to replace the multiple wire-bonding for the benefits of lower resistance and improved thermal performance, which is especially beneficial for higher reliability. However, the current interconnection materials and bonding processes cannot fully meet the reliability requirements of the emerging Cu clip integrated structure. Brazing alloys can serve in high-temperature conditions, since they have the melting points above 450 °C. However, very limited brazing alloys have been applied in electronics packaging since the processing temperature is also high if needs to be melted. It is promising to develop the low-temperature bonding technology which can serve at high temperatures. In this study, incorporating with the Cu-15Ag-5P brazing alloy as the interconnection material, the self-propagating exothermic reaction (SPER) has been applied to assist the Cu clip bonding process, which provides intense local heating to achieve the interconnects in millisecond scale. The bonding mechanism between Cu-15Ag-5P and Cu substrate is examined and discussed. The research findings promise an effective assembly route viable for the application of high-power electronics packaging.
Funding
Underpinning Power Electronics 2017: Heterogeneous Integration
Engineering and Physical Sciences Research Council
Find out more...Quasi-ambient bonding to enable cost-effective high temperature Pb-free solder interconnects
Engineering and Physical Sciences Research Council
Find out more...Loughborough University
China Scholarship Council (CSC) (Reference No. 201806220073)
History
School
- Aeronautical, Automotive, Chemical and Materials Engineering
- Mechanical, Electrical and Manufacturing Engineering
Department
- Materials
Published in
Microelectronics ReliabilityVolume
138Publisher
ElsevierVersion
- VoR (Version of Record)
Rights holder
© The AuthorsPublisher statement
This is an Open Access Article. It is published by Elsevier under the Creative Commons Attribution 4.0 International Licence (CC BY). Full details of this licence are available at: https://creativecommons.org/licenses/by/4.0/Acceptance date
2022-07-25Publication date
2022-09-25Copyright date
2022ISSN
0026-2714Publisher version
Language
- en