1-s2.0-S0272884221006362-main.pdf (5.44 MB)
Silica-silicon composites for near-infrared reflection: A comprehensive computational and experimental study
journal contribution
posted on 2021-10-08, 08:56 authored by Kevin Conley, Shima Moosakhani, Vaibhav Thakore, Yanling Ge, Joonas Lehtonen, Mikko Karttunen, Simo-Pekka Hannula, Tapio Ala-NissilaTapio Ala-NissilaCompact layers containing embedded semiconductor particles consolidated using pulsed electric current sintering exhibit intense, broadband near-infrared reflectance. The composites consolidated from nano- or micro-silica powder have a different porous microstructure which causes scattering at the air-matrix interface and larger reflectance primarily in the visible region. The 3 mm thick composite compacts reflect up to 72% of the incident radiation in the near-infrared region with a semiconductor microinclusion volume fraction of 1% which closely matches predictions from multiscale Monte Carlo modeling and Kubelka-Munk theory. Further, the calculated spectra predict a reddish tan compact with improved reflectance can be obtained by decreasing the average particle size or broadening the standard deviation. The high reflectance is achieved with minimal dissipative losses and facile manufacturing, and the composites described herein are well-suited to control the radiative transfer of heat in devices at high temperature and under harsh conditions.
Funding
Academy of Finland project 314488 and QTF Centre of Excellence program (312298, KC and TAN)
History
School
- Science
Department
- Mathematical Sciences
Published in
Ceramics InternationalVolume
47Issue
12Pages
16833 - 16840Publisher
Elsevier BVVersion
- VoR (Version of Record)
Rights holder
© The AuthorsPublisher statement
This is an Open Access Article. It is published by Elsevier under the Creative Commons Attribution 4.0 International Licence (CC BY 4.0). Full details of this licence are available at: https://creativecommons.org/licenses/by/4.0/Acceptance date
2021-02-27Publication date
2021-03-04Copyright date
2021ISSN
0272-8842eISSN
1873-3956Publisher version
Language
- en