Spatially and spectrally resolved electroluminescence measurement system for photovoltaic characterisation
journal contributionposted on 08.06.2015, 09:28 by Martin BlissMartin Bliss, Xiaofeng Wu, Karl Bedrich, Jake BowersJake Bowers, Tom BettsTom Betts, Ralph Gottschalg
A system that combines the advantages of fast global electroluminescence (EL) imaging and detailed spectrally resolved EL measurements is presented. A charge-coupled device camera-based EL imaging system is used to measure the intensity of radiative recombination of the photovoltaic (PV) device spatially resolved over its full area. A monochromator-based system is utilised to measure localised emission spectra at given points of interest. Measurements of multi-crystalline and amorphous silicon PV devices demonstrate the potential to investigate radiative defects and reveal performance variations and non-uniformities. This links inhomogeneities much closer to device physics than using camera-based EL only.
This work has been supported by a joint UK–India initiative in solar energy through a joint project ‘Stability and Performance of Photovoltaics (STAPP)’ funded by the Research Councils UK (RCUK) Energy Programme in UK [grant no: EP/H040331/] and by the Department of Science and Technology (DST) in India.
- Mechanical, Electrical and Manufacturing Engineering