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Spatially and spectrally resolved electroluminescence measurement system for photovoltaic characterisation

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journal contribution
posted on 2015-06-08, 09:28 authored by Martin BlissMartin Bliss, Xiaofeng Wu, Karl Bedrich, Jake BowersJake Bowers, Tom BettsTom Betts, Ralph Gottschalg
A system that combines the advantages of fast global electroluminescence (EL) imaging and detailed spectrally resolved EL measurements is presented. A charge-coupled device camera-based EL imaging system is used to measure the intensity of radiative recombination of the photovoltaic (PV) device spatially resolved over its full area. A monochromator-based system is utilised to measure localised emission spectra at given points of interest. Measurements of multi-crystalline and amorphous silicon PV devices demonstrate the potential to investigate radiative defects and reveal performance variations and non-uniformities. This links inhomogeneities much closer to device physics than using camera-based EL only.


This work has been supported by a joint UK–India initiative in solar energy through a joint project ‘Stability and Performance of Photovoltaics (STAPP)’ funded by the Research Councils UK (RCUK) Energy Programme in UK [grant no: EP/H040331/] and by the Department of Science and Technology (DST) in India.



  • Mechanical, Electrical and Manufacturing Engineering

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IET Renewable Power Generation


BLISS, M. ... et al, 2015. Spatially and spectrally resolved electroluminescence measurement system for photovoltaic characterisation. IET Renewable Power Generation, 9(5), pp.446-452.


Institution of Engineering and Technology


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This is an Open Access Article published by IET and distributed under the terms of the Creative Commons Attribution 3.0 License (http://www.creativecommons.org/licenses/by/3.0/) which permits any use, reproduction and distribution of the work without further permission provided the original work is attributed.




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