eck.pdf (820.04 kB)
Download fileStructural intensity measurement using electronic speckle pattern interferometry
journal contribution
posted on 2010-08-20, 15:18 authored by Thomas Eck, Stephen Walsh, M. Dale, N.C. TaylorStructural intensity measurement using electronic speckle pattern interferometry
History
School
- Aeronautical, Automotive, Chemical and Materials Engineering
Department
- Aeronautical and Automotive Engineering