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Sub-monolayer growth of Ag on flat and nanorippled SiO2 surfaces

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posted on 21.06.2016, 13:28 authored by Mukul Bhatnagar, Mukesh Ranjan, Kenny JolleyKenny Jolley, Roger SmithRoger Smith, Subroto Mukherjee
In-situ Rutherford Backscattering Spectrometry (RBS) and Molecular Dynamics (MD) simulations have been used to investigate the growth dynamics of silver on a flat and the rippled silica surface. The calculated sticking coeficient of silver over a range of incidence angles shows a similar behaviour to the experimental results for an average surface binding energy of a silver adatom of 0.2 eV. This value was used to parameterise the MD model of the cumulative deposition of silver in order to understand the growth mechanisms. Both the model and the RBS results show marginal difference between the atomic concentration of silver on the at and the rippled silica surface, for the same growth conditions. For oblique incidence, cluster growth occurs mainly on the leading edge of the rippled structure.

Funding

This work was funded by the UKIERI Grant: IND/CONT/E/13-14/642 and the programme DST-Nanomission.

History

School

  • Science

Department

  • Mathematical Sciences

Published in

Applied Physics Letters

Volume

108

Pages

223101-1 - 223101-4 (4)

Citation

BHATNAGAR, M. ...et al., 2016. Sub-monolayer growth of Ag on flat and nanorippled SiO2 surfaces. Applied Physics Letters, 108, pp. 223101-1 - 223101-4.

Publisher

American Institute of Physics (AIP)

Version

AM (Accepted Manuscript)

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/

Acceptance date

01/06/2016

Publication date

2016

Notes

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in BHATNAGAR, M. ...et al., 2016. Sub-monolayer growth of Ag on flat and nanorippled SiO2 surfaces. Applied Physics Letters, 108, pp. 223101-1 - 223101-4 and may be found at http://dx.doi.org/10.1063/1.4952950.

ISSN

1077-3118

Language

en

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