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The energy absorbed in the human head due to ring-type jewelry and face-illuminating mobile phones using a dipole and a realistic source

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posted on 2009-01-29, 11:57 authored by William WhittowWilliam Whittow, Chinthana PanagamuwaChinthana Panagamuwa, Robert EdwardsRobert Edwards, J. C. Vardaxoglou
The effect of facial ring jewelry is investigated on the energy absorbed in the head when illuminated by communicationsenabled personal data assistant (PDA)-type devices. We study the relative changes in specific absorption rates in the head due to perturbing metallic rings in proximity to the face illuminated by a 1.8 GHz dipole and a monopole on a conducting box. Simple and complex head models used in a validated finite-difference time-domain (FDTD) simulation are compared with measurements from an industry standard DASY4 SAR measurement system. Both simulation and measurement are referred to the IEEE specific anthropomorphic mannequin head. Results show that metallic rings may alter specific absorption rates (SAR) level distributions within the head. Results are given for several common ring sizes.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Citation

WHITTOW, W.G. ... et al, 2008. The energy absorbed in the human head due to ring-type jewelry and face-illuminating mobile phones using a dipole and a realistic source. IEEE Transactions on Antennas and Propagation, 56 (12), pp. 3812-3817

Publisher

© Institute of Electrical and Electronics Engineers (IEEE)

Version

  • VoR (Version of Record)

Publication date

2008

Notes

This article was published in the journal, IEEE Transactions on Antennas and Propagation [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

ISSN

0018-926X

Language

  • en