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Theoretical and experimental studies of off-the-shelf v-dot probes

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posted on 06.08.2018, 13:19 by Bucur NovacBucur Novac, Renzhen Xiao, Tom Huiskamp, Laurent Pecastaing, Meng Wang, Peter SeniorPeter Senior, Antoine Silvestre De Ferron, AJM Pemen, Mark Rivaletto
This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

IEEE Transactions on Plasma Science

Citation

NOVAC, B.M. ... et al., 2018. Theoretical and experimental studies of off-the-shelf v-dot probes. IEEE Transactions on Plasma Science, 46(8), pp. 2985-2992.

Publisher

© IEEE

Version

AM (Accepted Manuscript)

Acceptance date

03/07/2018

Publication date

2018

Notes

Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

ISSN

0093-3813

Language

en