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Thin films of AlCrFeCoNiCu high-entropy alloy by pulsed laser deposition

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journal contribution
posted on 12.06.2018, 08:27 by Michael CropperMichael Cropper
Pulsed laser deposition has been used to prepare thin films of the high entropy alloy AlCrFeCoNiCu. The 35 nm films were deposited in ultra-high vacuum onto glass at room temperature and above and analysed using X-ray diffraction and X-ray photoelectron spectroscopy. Films deposited at room temperature exhibit a mix of FCC and BCC reflections, the FCC crystallites having size similar to the film thickness, but the BCC crystallites are larger. The intensity of the reflections from both crystal structures reduce with increasing deposition temperature, the fall in BCC commencing at lower temperature than the FCC associated with a reduction of the content of Al and Cu. X-ray photoelectron spectroscopy shows that the films deposited at room temperature are closer to stoichiometry than those at higher temperatures. An important feature of the X-ray photoelectron spectroscopy depth profiles is surface segregation, the outer 3 nm of the high entropy alloy films has higher concentration of Al and, to a lesser extent, Cr.

History

School

  • Science

Department

  • Physics

Published in

Applied Surface Science

Volume

455

Pages

153 - 159

Citation

CROPPER, M.D., 2018. Thin films of AlCrFeCoNiCu high-entropy alloy by pulsed laser deposition. Applied Surface Science, 455, pp.153-159.

Publisher

© Elsevier

Version

AM (Accepted Manuscript)

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/

Acceptance date

22/05/2018

Publication date

2018-05-23

Notes

This paper was accepted for publication in the journal Applied Surface Science and the definitive published version is available at https://doi.org/10.1016/j.apsusc.2018.05.172

ISSN

0169-4332

Language

en

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