Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure.pdf (1.89 MB)
Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure
journal contributionposted on 2015-11-13, 15:12 authored by Nick Goffin, Fabiana Lisco, Alessandro Simeone, Gianfranco ClaudioGianfranco Claudio, John Tyrer, Elliot WoolleyElliot Woolley
Characterisation of Cadmium Telluride (CdTe) thin films commonly requires the use of invasive techniques for the identification of their structural growth and the detection of defects which occur during the deposition process. Structural growth and the presence of defects can affect the performance of the final device. A non-invasive inspection system for CdTe films has been developed to identify the structural properties of this material, comparing two different deposition techniques, Close Space Sublimation (CSS) and Magnetron Sputtering (MS). The proposed system utilises a 1 μm diode laser which passes through the CdTe layer, originating detectable diffraction patterns, which are characterised using image processing techniques and assessed using a neural network-based cognitive decision-making support system. Results are found to be consistent with the conventional microscopic techniques (SEM and TEM) used to analyse morphological and structural properties of thin-film CdTe solar cells.
This research has been funded by the Engineering and Physical Sciences Research Council (EPSRC) in the UK, with project number EP/M014088/1,
- Mechanical, Electrical and Manufacturing Engineering
Published inCIRPe 2015
Pages101 - 106 (6)
CitationGOFFIN, N.J. ... et al., 2015. Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure. Procedia CIRP 37, pp. 101-106.
Publisher© 2015 The Authors. Published by Elsevier
- VoR (Version of Record)
Publisher statementThis work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/
NotesThis is an Open Access Article. It is published by Elsevier under the Creative Commons Attribution 4.0 Unported Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0/ The paper was also presented at CIRPe 2015 - Understanding the life cycle implications of manufacturing, 29th Sept- 1st Oct, 2015.