Chong-IEEE Access- 2015-accepted.pdf (1.59 MB)
Download fileWrinkle detection using hessian line tracking
journal contribution
posted on 2016-02-09, 12:59 authored by Choon-Ching Ng, Moi Hoon Yap, Nicholas Costen, Baihua LiBaihua LiWrinkles play an important role in face-based
analysis. They have been widely used in applications such as
facial retouching, facial expression recognition and face age
estimation. Although a few techniques for wrinkle analysis have
been explored in the literature, poor detection limits the accuracy
and reliability of wrinkle segmentation. Therefore, an automated
wrinkle detection method is crucial to maintain consistency and
reduce human error. In this paper, we propose Hessian line
tracking (HLT) to overcome the identified problem. The proposed
HLT is composed of Hessian seeding and directional line tracking.
It is an extension of a Hessian filter; however it significantly increases
the accuracy of wrinkle localization when compared with
existing methods. In the experimental phase, three coders were
instructed to annotate wrinkles manually. To assess the manual
annotation, both intra- and inter-reliability were measured, with
an accuracy of 94% or above. Experimental results show that
the proposed method is capable of tracking hidden pixels; thus it
increases connectivity of detection in between wrinkles, allowing
some fine wrinkles to be detected. In comparison to the stateof-
the-art methods such as the Cula method, Frangi filter, and
hybrid Hessian filter, the proposed HLT yields better results,
with an accuracy of 84%. This work demonstrates that HLT is a
remarkably strong detector of forehead wrinkles in 2D images.
History
School
- Science
Department
- Computer Science
Published in
IEEE AccessVolume
3Pages
1079 - 1088Citation
NG, C.-C. ... et al, 2015. Wrinkle detection using hessian line tracking. IEEE Access, 3, pp.1079-1088Publisher
© IEEEVersion
- AM (Accepted Manuscript)
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2015Notes
This is the accepted manuscript version of the paper. © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.eISSN
2169-3536Publisher version
Language
- en