RC51.pdf (574.71 kB)
Computational modelling of the anisotropic conductive adhesive assembly process
online resourceposted on 2008-11-13, 15:10 authored by David Whalley, Greg Glinsky, Chris Bailey, Johan Liu
Previously developed analytical models of the anisotropic adhesive assembly process have successfully predicted the time for adhesive resin flow out and whether this can be successfully achieved before resin cure. Computational Fluid Dynamics models have also provided significant insights into the effects of the component and substrate bond pad geometry on the resin flow distribution and hence on the resulting final conductive particle distribution. These computational models have however used Newtonian, i.e. non-shear thinning, flow properties for the adhesive materials. This paper will present initial results from the development of more sophisticated models, which include both the non-Newtonian and the temperature dependent flow of the adhesive. Such models can be used to allow a much more detailed investigation of the interactions of the adhesive resin flow characteristics, the component and substrate materials and geometry, and the assembly process parameters. These models, once fully developed and validated, will therefore lead to a better understanding of the assembly process and facilitate establishment of design rules for different applications
- Mechanical, Electrical and Manufacturing Engineering
CitationWHALLEY, D.C....et al., 2001. Computational modelling of the anisotropic conductive adhesive assembly process. IN: Advances in Electronic Materials and Packaging, (EMAP 2001), Nov 19th-22nd, Jeju Island, South Korea, pp. 393-398 .
NotesThis is a conference paper and the definitive version is also available at: http://ieeexplore.ieee.org. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.