posted on 2014-02-26, 11:46authored byDan Wu, Jiang Zhu, Thomas R. Betts, Ralph Gottschalg
This paper presents the degradation study results of adhesion strength between backsheet and encapsulant for a commercial minimodule. A degradation model for the adhesion strength is developed and the activation energy is obtained.
Outdoor prediction example is given based on environmental data in Loughborough and Denver
History
School
Mechanical, Electrical and Manufacturing Engineering
Research Unit
Centre for Renewable Energy Systems Technology (CREST)
Citation
WU, D. ... et al., 2013. Degradation study of the peel strength of mini-modules under damp heat condition. Poster presented at the National Renewable Energy Laboratory (NREL) PV Module Reliability Workshop (PVMR), 2013.