Thesis-1998-Albrecht.pdf (34.3 MB)
Electronic Speckle Pattern Interferometry: instruments development, optimisation and applications
thesis
posted on 2018-04-06, 10:30 authored by Daniel J.F. AlbrechtOptical interferometric techniques are being increasingly used in industry. These non contact
techniques, using laser methods based on speckle interferometry, assure a greater accuracy in
measuring displacements caused by deformations. One such technique, Electronic Speckle Pattern
Interferometry (ESPI), has been used successfully, by analysis of the reaction of mechanical
components to induced mechanical or thermal stress, for the measurements of in-situ, real time,
full-field, in-plane and out-of-plane displacements and the detection of detachments, micro-cracks
occurring as internal and external defects. [Continues.]
Funding
European Commission.
History
School
- Science
Department
- Physics
Publisher
© D. AlbrechtPublisher statement
This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/Publication date
1998Notes
A Doctoral Thesis. Submitted in partial fulfilment of the requirements for the award of Doctor of Philosophy at Loughborough University.Language
- en