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Extraction of displacement data from Electronic Speckle Pattern Interferometric fringe patterns using digital image processing techniques

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posted on 2018-01-19, 15:29 authored by David Kerr
The commercial exploitation of Electronic Speckle Pattern Interferometry (ESPI) is now gathering pace with manufacturers marketing products in Europe and the USA. The power of the technique both in a research and an industrial inspection role has brought pressure from the engineering community for an automated fringe analysis system. [Continues.]

Funding

Science and Engineering Research Council, ACME Directorate.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Publisher

© David Kerr

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 2.5 Generic (CC BY-NC-ND 2.5) licence. Full details of this licence are available at: http://creativecommons.org/licenses/by-nc-nd/2.5/

Publication date

1992

Notes

A Doctoral Thesis. Submitted in partial fulfilment of the requirements for the award of Doctor of Philosophy at Loughborough University.

Language

  • en

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    Mechanical, Electrical and Manufacturing Engineering Theses

    Categories

    Keywords

    untaggedMechanical Engineering not elsewhere classified

    Licence

    CC BY-NC-ND 2.5

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